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1

X-ray metrology in semiconductor manufacturing

X-ray metrology in semiconductor manufacturing

CRC/Taylor & Francis

D. Keith Bowen, Brian K. Tanner

साल:

2006

भाषा:

english

फ़ाइल:

PDF, 10.48 MB

0 / 0

english, 2006

2

X-ray metrology in semiconductor manufacturing

X-ray metrology in semiconductor manufacturing

CRC Press / Taylor & Francis

David Keith Bowen, Brian Keith Tanner

साल:

2006

भाषा:

english

फ़ाइल:

PDF, 8.99 MB

0 / 0

english, 2006

3

Intrinsically Disordered Protein Analysis: Volume 2, Methods and Experimental Tools

Intrinsically Disordered Protein Analysis: Volume 2, Methods and Experimental Tools

Springer-Verlag New York

Ucheor B. Choi, Keith R. Weninger, Mark E. Bowen (auth.), Vladimir N. Uversky, A. Keith Dunker (eds.)

साल:

2012

भाषा:

english

फ़ाइल:

PDF, 7.12 MB

0 / 5.0

english, 2012

4

Engineering Geology of Western United States Urban Centers: Los Angeles, California to Denver, Colorado June 27-July 7, 1989

Engineering Geology of Western United States Urban Centers: Los Angeles, California to Denver, Colorado June 27-July 7, 1989

American Geophysical Union

Jeffrey R. Keaton, Richard Morris, Joe Cobarrubias, John H. Hansen, Mike Hart, Bill Cotton, John Bell, Gary Christenson, Bill Lund, Tim Bowen, Jerry Higgins, Keith Turner, Jeff Hynes(auth.)

साल:

1991

भाषा:

english

फ़ाइल:

PDF, 5.62 MB

0 / 0

english, 1991

5

Characterization of Crystal Growth Defects by X-Ray Methods

Characterization of Crystal Growth Defects by X-Ray Methods

Eugene S. Meieran (auth.), Dr. Brian K. Tanner, Dr. D. Keith Bowen (eds.)

साल:

1980

भाषा:

english

फ़ाइल:

PDF, 18.06 MB

0 / 0

english, 1980

6

Advances in X-Ray Analysis: Volume 38

Advances in X-Ray Analysis: Volume 38

Robert L. Snyder, Bin-Jiang Chen (auth.), Paul K. Predecki, D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Deane K. Smith (eds.)

साल:

1995

भाषा:

german

फ़ाइल:

PDF, 51.07 MB

0 / 0

german, 1995